{
  "title": "AxioImager A2R",
  "kind": "document",
  "company": "Allied High Tech Products",
  "category": "Metrology & quality control",
  "parameters": {
    "Language": "English",
    "Captured": "2026-10-17",
    "Document type": "downloads",
    "PDF pages": 19
  },
  "language": "en",
  "source_url": "https://www.alliedhightech.com/Media/Default/EquipmentBrochures/AxioImager%20A2R.pdf",
  "content_html": "<p>AxioImager A2R</p><p><a href=\"/files/allied-file-2fd620e49d93b0b38d55a0ea/AxioImager%20A2R.pdf\">Open original PDF</a></p><details><summary>Full searchable text · 19 pages</summary><p>Refer to the original PDF for tables, figures and page layout.</p><pre style=\"white-space:pre-wrap\">Page 1\nThe Standards: Light Microscopy for the Toughest\nChallenges in Materials Analysis and Quality Control\nAxio Imager 2\nA New Dimension in Performance\nMic ro s c o py  f ro m  C a r l  Zei s s\n\n\nPage 2\nAxio Imager 2\nVisionary Performance\nWhether in R&amp;D, quality control or failure analysis, the \nchallenges facing materials microscopy are becoming \ngreater every day. With the triedandtested Axio Imager \nsystem platform from Carl Zeiss you will be able to win \nthese challenges. The Axio Imager microscopes offer the \nvery highest quality: sharper images, higher optical and \noperational performance with greater comfort – not only \nin research, but also in routine applications. Axio Imager 2 \nstands out thanks to its sophisticated operating concept \nand ﬂexible interfaces for external communication and \nnetwork connections. And Carl Zeiss’ future-oriented \nmodular concept means that these durable and robust \nsystems will be able to cope with any future requirements \nthat arise. Several outstanding features of this second-\ngeneration Axio Imager are: \n• an optimized operating concept \n• improved optics with superb contrast and excellent \n resolution\n• forward-looking stand concept for upgradeability\n• innovative design for maximum stability and \n vibration-free work\n• optional automated functions for enhanced operating \n comfort\n• exceptional ergonomics for stress-free use\n• an integrated system approach for digital imaging \n solutions providing high quality reproducible results\nWith this second-generation Axio Imager Carl Zeiss is \nresponding to the increasing demands of industry and \nacademia. Put your faith in a reliable, powerful and \ncost-effective analysis platform and in the optimized quality \nof light microscopy.\nCover image: cast iron with spherulitic graphite, polished.\nCircular Differential Interference Contrast\nEC Epiplan-APOCHROMAT 50x/0.95\nWith kind permission of Dr. H.-L. Steyer, Struers, Kesselsdorf, \nGermany\n\n\nPage 3\nContents\nThe Optics  \n4\nThe Contrasting Techniques  \n6\nThe Areas of Application \n8\nThe Software   \n10\nThe Cameras    \n12\nConfocal Laser Scanning Microscopy  \n13\nThe Design   \n14\nThe Ergonomics \n15\nSpeciﬁcations   \n16\nSystem Overview  \n18\n\n\nPage 4\n4\nThe Optics\nA New Quality Before Your Eyes\nThe objective series\nExperience enhanced contrast (EC)\nTo obtain comprehensive image information, you need to use \na wide range of objectives. With the Axio Imager objective \nseries Carl Zeiss has provided solutions for all levels of optical \nrequirements and price / performance categories.\nEC EPIPLAN objectives\nAn economical, all-around series of objectives, which have \nbeen achromatically corrected with minimum optically \nstrain for an impressive quality DIC, and, in addition, pro-\nviding a ﬂat ﬁeld image for a 23 mm ﬁeld of view. They are \navailable in brightﬁeld or brightﬁeld/darkﬁeld versions. \nDifferential Interference Contrast in circularly polarized \nlight is also possible with all EC EPIPLAN objectives using \nonly a single C-DIC prism.\nEC Epiplan-NEOFLUAR objectives\nThe particularly high-contrast EC Epiplan-NEOFLUAR \nobjectives, which have high degree of correction and \nminimized optical strain, enabling you to achieve sharp \nC-DIC and a ﬂat, in focus, 25 mm ﬁeld of view – ideal for \nviewing ﬁne color and structural details, e.g. lamellae in \nspherulitic graphite. Available as DIC/C-DIC, Brightﬁeld/\nDarkﬁeld, Pol and LD (long working distance) versions, \nthey also offer the additional benefits of long working \ndistances and high numerical apertures.\nEC Epiplan-APOCHROMAT objectives\nThe EC Epiplan-APOCHROMAT objectives satisfy the very \nhighest demands. They are ideal for imaging color and \nstructural details in the sub-micrometer range and are \nrenowned for offering the best optical correction and \nhighest numerical apertures. Based on ICS optics from \nCarl Zeiss, these innovative Enhanced Contrast objectives \nperform at the limits of what optics can achieve with regard \nto contrast and image ﬁdelity. \nThe new Axio Imager generation is the result of the latest innovations in optical \ndesign. Carl Zeiss has taken its renowned optical performance to new heights once \nagain and has carefully designed and optimized all relevant components. Discover \nthe visible advances that have been made in image contrast and resolution.\nThe illumination concept\nObtain brilliant image quality\nAn innovative illumination concept has been specially deve-\nloped for the Axio Imager, enabling you to see your specimen \nin brightﬁeld and darkﬁeld with unprecedented quality, \nminimized stray light and imaging that is virtually aberration \n-free. Outstanding image contrast is achieved, especially in \ninterference contrast, even at very high magniﬁcations.\nFurther information \ncan be found at \nwww.zeiss.de/objectives\n\n\nPage 5\n5\nGreater comfort, simple change of \ncontrasting techniques: the modulator \nturret for interference contrast\nThe tube lens turret\nIncrease your ﬂexibility\nWith its expanded magniﬁcation range comprising a total \nof ﬁve intermediate magniﬁcations, the Axio Imager tube \nlens turret offers greater variability when it comes to ad-\napting the desired ﬁeld of view. The tube lens turret is \navailable in two models. 1) Encoded: this model allows \nmanual operation of the tube lens turret (magniﬁcation \nchange) while providing automatic feedback of the user \nselection for reliable and repeatable documentation, \nscaling factors and measurements. 2) Motorized: this model \noffers you additional operating comfort for your system \nsolutions by automatic selection based on user-deﬁned \nconﬁgurations. The tube lens turret offers yet another \nadvantage: the use of a focusable Bertrand lens, an impor-\ntant component for the easy observation of the objective \nexit pupil.\nThe modulator turret\nEasy to operate\nSwitching quickly and easily from interference contrast to \nother techniques – the Axio Imager modulator turret has \nbeen developed precisely with this goal in mind. Each of \nthe four positions can be easily selected with a simple \nturn. The motorized model is particularly easy to operate. \nWhen switching to interference contrast, the correct \nprism with the setting you have previously defined is \nautomatically activated. If you switch to brightﬁeld or \ndarkﬁeld, the path is cleared automatically for fast and, \nabove all, reproducible results.\nThe reﬂector turret\nFast switching made easy\nAll Push&amp;Click contrast modules can be stored securely in \nsix or ten positions and activated as needed using manual \nor motorized operation.\nMotorized apertures\nMaintaining constant image quality\nUsing the motorized aperture and luminous field \ndiaphragms you can achieve error-free, reproducible \nillumination settings and, consequently, constant image \nquality. System integrated motorization guarantees you \ncomparable results and higher productivity by automating \nthe workﬂow.\nThe nosepiece\nSeven eyes see more\nThe Axio Imager nosepiece provides room for up to seven \nobjectives. You now have a sufﬁcient number of objectives \nto use the entire standard magniﬁcation series from 1x to \n100x. Naturally, it is also possible to combine objective \ntypes, for example reﬂected light and transmitted light \nobjectives. Seven eyes – or room for seven objectives – \nalso mean that it is no longer necessary to exchange the \nobjectives, saving you time and increasing safety. \nMore options, faster handling:\nthe reflector turrets with Push&amp;Click modules\nMonitor: Al/Al2O3 \ncomposite material\nDirk Staudenecker, \nUniversity of Applied \nSciences, Materials \nEngineering Working \nGroup, Aalen, Germany\n\n\nPage 6\n6\nThe Contrasting Techniques\nObserving in New Dimensions\nBrightﬁeld and darkﬁeld\nMaximum homogeneity and a stray light free image \nbackground \nIn brightfield the Axio Imager provides homogeneous \nillumination and exceptional contrast while, in darkﬁeld, \nthe background is so dark that the technique has earned a \nnew name: ADF – Advanced Darkfield. By minimizing \ndisturbing stray light and reducing the longitudinal color \naberration of the illumination optics, this darkfield is \nsuitable for the most challenging of samples and impresses \neven when faced with the ﬁnest of structures. Switching \nbetween techniques only requires a simple turn. The \nmotorized stand models allow you to work particularly \nquickly and conveniently.\nC-DIC\nPerfect for all structures\nCircular Differential Interference Contrast (C-DIC) is a \npolarization-optical technique which, in contrast to ordina-\nry Differential Interference Contrast (DIC), uses circularly \npolarized light. This technique has a number of decisive \nadvantages for the contrasting of differently aligned object \nstructures. The specimen no longer has to be rotated for \nbest image contrast and quality, as is the case in basic DIC. \nWith C-DIC it is simply enough to adjust the position of the \nC-DIC prism to adjust for best image quality whether it \nis for contrast and/or resolution independent of sample \norientation. And all this is possible using one C-DIC prism \nfor a homogeneous unsurpassed quality image. \nNew imaging options improve the visualization of your samples. The developments \nwe make at Carl Zeiss lead to new discoveries in research and more reliable testing \nand results. This applies not only to standard, but also, in particular, to sophisticated \ncontrasting techniques, like the innovative C-DIC method. Axio Imager 2 will clearly \nenable you to enhance your results.\nBefore: if the rules according to Köhler are \nnot precisely followed only inferior contrast \nimages are possible, even with the best \nobjectives.\nAfter: ADF – Advanced Darkfield from \nCarl Zeiss. The result speaks for itself.\nAugust Köhler, Zeiss pioneer and one of the pioneers in microscopy.\nThe illumination principle named after him revolutionized microscopy.\nKLA-Test structures, period 1.6 μm\nEC Epiplan-APOCHROMAT 50x/0.95, ∞/0, camera-adapter 0.63x\n50 μm\n50 μm\n\n\nPage 7\n7\nBrightﬁeld:\nClassic brightﬁeld allows you to identify only the spherulitic formation. \nMatrix: white (bright), graphite: black (dark).\nDarkﬁeld:\nUnevenness in the polished surface (such as grooves of the phase boundaries between \ngraphite and matrix or notches) clearly reveals the shape of the spherulites and thus \nthe polishing quality. Structural features within the cut spherulites can be identiﬁed. \nStarting from the crystallization nucleus, the cut surfaces of the graphite segments \nbecome visible in their divergent orientation (preferred direction of crystallization). \nIncomplete polished spherulites contain bright points and more extensive bright areas.\nCircular Differential Interference Contrast (C-DIC):\nThe matrix is contrasted on the basis of the polishing relief. Hard and soft structural \nconstituents become visible, as does what remains of the polishing striae (exclusively \nmechanically polished).\nPolarization (crossed polars):\nThe optical activity, in particular anisotropy, makes the structure inside the  \nspherulites clearly visible.\nPolarization with additional lambda compensator:\nThis technique allows optimal contrasting of the structure inside the spheru lite sec-\ntion. The interference colors make it possible to see even more details than with \nsimply crossed polars.\n20 μm\n20 μm\n20 μm\n20 μm\n20 μm\nCast iron with spherulitic \ngraphite, polished.\nImages: same position and \nsame magnification, but with \ndifferent contrasting tech-\nniques. Specimen preparation \nand image interpretation:\nDr. H.-L. Steyer, Kesselsdorf, \nGermany\n\n\nPage 8\n8\nThe Areas of Application\nOpting for Versatility\nThe applications\nOpaque or transparent\nThe range of materials and samples encountered in quality \ncontrol, materials testing and research is vast. Axio Imager \noffers the perfect solution for performing analyses. \nMetallic structures, composites, glass, wood and ceramics \ncan be analyzed just as effectively as polymers, liquid \ncrystals or semiconductor-based MEMs, wafers and photo-\n voltaic elements, for example.\nContrasting\nCompetence in all contrasting techniques\nAdditional information helps you to make decisive \nadvances. You can choose from a variety of contrasting \ntechniques to achieve optimum optical quality for your \napplications: in reﬂected light it is possible to observe your \nsamples in brightﬁeld, darkﬁeld, Differential Interference \nContrast (DIC), Circular Differential Interference Contrast \n(C-DIC), polarization or ﬂuorescence contrast, while in \ntransmitted light, you can examine your samples in bright-\nﬁeld, darkﬁeld, Differential Interference Contrast (DIC), \npolarization or circular polarization.\nThe sample space can \nbe adjusted continuously \nfor sample heights from \n0 to 63 mm.\nThe sample area\nFor samples from just a few μm to 63 mm in height\nYou can adjust the sample space individually to suit your \nparticular sample. The size can be adjusted within wide \nranges, depending on the conﬁguration. If you are using \na reflected light stage support in combination with a \nreﬂected light stage, it is possible to examine samples of \nup to 63 mm in height, while with a transmitted light \nstage support and transmitted light stage a height of \n45 mm can be achieved.\nAxio Imager 2 is an investment in the future, whether in the area of research, testing or failure \nanalysis. Here you will ﬁnd a system integrated platform that offers you the perfect support \nfor your applications. Time and again the modular structure and application-speciﬁc \ncomponents will adapt to the growing and changing needs faced in our fast paced world. \nThe stage carrier can be removed or its height adjusted by hand.\n\n\nPage 9\n9\nLiquid-crystalline phase of [C14mim]Br  \nPolarization contrast EC EPIPLAN 10x/0.20 at \n100 °C in a THMS600 Linkam heating stage\nAnna Getsis and Anja-Verena Mudring, Faculty \nof Chemistry and Biochemistry, Solid-State \nChemistry and Materials, Ruhr-University \nBochum, Germany\nBundle of stretched polyelectrolyte molecules\nRhodamine G stain with fluorescence\nLD EC Epiplan-NEOFLUAR 100x/0.75\nKonstantin Demidenok, Leibniz Institute of \nPolymer Research Dresden e.V., Germany\nTetrahedral inclusions in glass\nBrightfield\nSCHOTT AG, Corporate Research and  \nTechnology Development, Mainz, Germany\nLayer of gold detaching from a silicon wafer\nBrightfield ACHROPLAN 10x/0.25\nFraunhofer Institute for Manufacturing \nTechnology and Applied Materials Research, \nDepartment for Bonding Technology and \nSurfaces, Bremen, Germany\nMicrohardness impression in a maraging steel\nBrightfield EC Epiplan-NEOFLUAR, 50x/0.80\nSébastien Reymann, University of Applied \nSciences, Materials Engineering Working \nGroup, Aalen, Germany \nMagnetic domains on a silicon-iron electrical \nsheet Kerr microscopy\nEC Epiplan-NEOFLUAR 20x/0.50\nDr. Rudolf Schäfer, Leibniz Institute for \nSolid State and Materials Research Dresden, \nGermany\nAlNi3,5 anodized according to Barker\nPolarization contrast\nEC Epiplan-NEOFLUAR 20x/0.50\nACCESS e.V. Aachen and Foundry Institute  \nof RWTH Aachen  University, Germany\nMaraging steel recast structure, nital etch  \nwith white, unetched areas\nDifferential Interference Contrast\nEC Epiplan-NEOFLUAR, 50x/0.80\nSébastien Reymann, University of Applied \nSciences, Materials Engineering Working \nGroup, Aalen, Germany\nStructure of the surface of a furniture wood\nDarkfield EC Epiplan-\nAPOCHROMAT 10x/0.30\nCarl Zeiss MicroImaging GmbH, \nLight Microscopy, Göttingen, Germany\nStress cracks in acrylate layer\nBrightfield ACHROPLAN 10x/0.25\nFraunhofer Institute for Manufacturing \nTechnology and Applied Materials Research, \nDepartment for Bonding Technology and \nSurfaces, Bremen, Germany\n\n\nPage 10\n15\nThe Ergonomics\nRelax While You Work\nThe touch screen\nAll key information at a glance\nTo simplify complex steps, Axio Imager.Z2m and .M2m \nhave all the main functions grouped together on a color \ntouch screen TFT-Display. This allows you to control all \nmotorized components easily at the touch of a button and \ndisplay and control the microscope status. If required, the \nintegrated light and contrast managers ensure the best \npossible light and contrast setting. In addition to ﬁxed \npresettings, it is also possible to store complex procedures \nas individual settings and retrieve them at any time with \njust the touch of a button. The Axio Imager microscopes \nare therefore ideal even in a multi-user environment.\nThe control buttons\nIntuitive operation\nAxio Imager has a well-designed operating concept. The \ncontrol buttons, which are arranged ergonomically around \nthe focusing drive, can be easily distinguished thanks to \ntheir tactile surfaces. The manual stand has ﬁve pre-pro-\ngrammed buttons, while the motorized stand features ten \nbuttons, the functions of which can be freely conﬁgured.\nThe docking station\nRemote microscopy\nAxio Imager can be remotely controlled using a freely-\npositionable control panel. This panel includes among \nother features a focusing drive and illumination control. \nOther functions can also be programmed, as required. \nThe panel offers an interface for the TFT-Display and for the \nlateral X-Y control of the motorized stage. A well developed \nconcept that gives you a greater freedom of movement \nand is highly ergonomic.\nThe ergophototube\nRelaxed working\nWith its upright, unreversed image, 50 mm continuous height \nadjustment, ergonomic, ﬁxed viewing angle of 15º and a \ncontinuous horizontal extension of 50 mm, the 50-15-50 \nergophototube from Carl Zeiss satisfies the highest \nstandards in terms of comfort and provides unrestricted \noptical quality in all positions.\nErgophototube\nTFT-Display\nReflected light filter\nMultifunctional control element\nDocking station\n\n\nPage 11\n16\nSpecifications\nAxio Imager.A2m\nAxio Imager.M2m\nAxio Imager.D2m\nAxio Imager.Z2m\nComponents\nOption\nA2 \nLED\nA2\nM2p\nM2\nD2\nZ2\nA2m\nM2m\nD2m\nZ2m\nStand\nmanual\n+\n+\n-\n-\n+\n-\n+\n-\n+\n-\nmotorized\n-\n-\n+\n+\nO*\n+\n-\n+\nO*\n+\nEncoding\nreadable by PC\n+\n+\n+\n+\n+\n+\n+\n+\n+\n+\nTube lens turret\nencoded\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nmotorized\n-\n-\nO\nO\n-\nO\n-\nO\n-\nO\nReﬂector turret\n6x encoded\nO\nO\nO\nO\nO\nO\nO\n-\nO\nO\n6x motorized\n-\n-\nO\nO\nO\nO\n-\n+\nO\nO\n6x motorized ACR\n-\n-\n-\n-\n-\nO\n-\n-\n-\nO\n10x motorized ACR**\n-\n-\n-\n-\nO\nO\n-\n-\nO\nO\nNosepiece\n6x encoded  POL\nO\nO\n-\nO\nO\nO\nO\nO\nO\nO\n6x encoded HD DIC\nO\nO\n-\nO\nO\nO\nO\nO\nO\nO\n6x motorized HD DIC\n-\n-\n-\nO\n-\nO\n-\nO\n-\nO\n6x motorized HD DIC ACR\n-\n-\n-\nO\n-\nO\n-\nO\n-\nO\n7x encoded HD\nO\nO\n+\nO\nO\nO\nO\nO\nO\nO\n7x motorized HD\n-\n-\n-\nO\n-\nO\n-\nO\n-\nO\nModulator turret C-DIC/TIC \nmanual\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nmotorized*****\n-\n-\n-\nO\n-\nO\n-\nO\n-\nO\nModulator turret for \ntransmitted light - DIC\nmotorized*****\n-\n-\n-\n-\n-\nO\n-\n-\n-\nO\nTransmitted light LED\n-\n+\nO\n+\nO\nO\nO\nO\nO\nO\nO\nTransmitted-light illumination\nmanual\n-\n+\n-\n-\n+\n-\nO\nO\nO\nO\nmotorized\n-\n-\n-\n+\n-\n+\n-\n-\n-\nO\nDouble ﬁlter wheel \n(transmitted light)\nmanual\n-\n+\n-\nO\nO\nO\nO\nO\nO\nO\nmotorized\n-\n-\n-\nO\n-\nO\n-\n-\n-\nO\nReﬂected-light illumination\nmanual***\nO\nO\nO\nO\nO\nO\n+\n-\n+\n-\nmotorized***\n-\n-\n-\n-\n-\nO\n-\n+\n-\n+\nLuminous ﬁeld diaphragm \n(reﬂected light)\nmanual\nO\nO\nO\nO\nO\nO\n+\nO\n+\nO\nmotorized\n-\n-\n-\n-\n-\nO\n-\nO\n-\nO\nAperture diaphragm \n(reﬂected light)\nmanual\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nmotorized\n-\n-\n-\n-\n-\nO\n-\nO\n-\nO\nDouble ﬁlter wheel \n(reﬂected light)\nmanual\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nmotorized\n-\n-\n-\nO\n-\nO\n-\nO\n-\nO\nFL attenuator\nmanual\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nmotorized\n-\n-\n-\n-\n-\nO\n-\nO\n-\nO\nSwitching reﬂected \nlight/transmitted light\nmanual\n+\n+\n-\n-\n+\n-\n+\n-\n+\n-\nby means of a software \n-\n-\n+\n+\n-\n+\n-\n+\n-\n+\nMixed light using additional \npower supply unit\nmanual\n+\n+\n-\n-\n+\n-\n+\n-\n+\n-\nby means of a software \n-\n-\n+\n+\n-\n+\n-\n+\n-\n+\nFocus (z-axis)\nmanual\n+\n+\n-\n-\n+\n-\n+\n-\n+\n-\nmotorized 25 nm\n-\n-\n+\n+\n-\n-\n-\n+\n-\n-\nHigh-performance focus (10 nm)\n-\n-\n-\n-\n-\n+\n-\n-\n-\n+\nTFT-Display\n-\n-\n-\nO\n+\n-\n+\n-\n+\n-\n+\nApoTome\n-\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nPower supply unit\nexternal\n-\n-\n+\n+\n-\n+\n-\n+\n-\n+\ninternal\n+\n+\n-\n-\n+\n-\n+\n-\n+\n-\nCAN BUS stages  \nmotorized****\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nScanning stages  \n \nPiezo\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nDC / stepper motors\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nFast Z-Piezo insert\nwith manual stage\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nwith scanning stage\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nMotorized 2TV tube\n-\n-\n-\nO\nO\n-\nO\n-\nO\n-\nO\nCondensers\nmanual\nO\nO\nO\nO\nO\nO\nO\nO\nO\nO\nmotorized\n-\n-\nO\nO\n-\nO\n-\nO\n-\nO\n\n\nPage 12\n17\n+ \n=  included with stand\nO \n=  optional\n- \n=  not possible \n* \n=  possible to use motorized (6-pos. and 10-pos.) reﬂector turret\n**  \n=  ACR function not possible with Axio Imager.D2 and .D2m\n*** \n=  all reﬂected light illuminations contain a motorized shutter\n \n    This can be replaced by a high-speed shutter for ﬂuorescence applications (optional).\n****  =  for use on the Axio Imager.A2, .A2m, .D2 and .D2m, USB/CAN converter 432909 is required\n*****  =  only in connection with motorized nosepiece\nMeasurements\nin mm (inch) \nStand\nAxio Imager.A2m\nAxio Imager.M2m\nAxio Imager.D2m\nAxio Imager.Z2m\nContrast manager\n-\n+\n-\n+\nLight manager\n+\n+\n+\n+\nTFT-Display\n-\n+\n-\n+\nRemote control\n-\nO (docking station)\n-\nO (docking station)\nHeight of sample space\n0 – 63 mm (reﬂected-light stage carrier)\n0 – 45 mm (reﬂected-light/transmitted-light stage carrier for removable condenser holder)\n0 – 25 mm (reﬂected-light/transmitted-light stage carrier with condenser holder)\nDepth of sample space\n136 mm (distance from optical axis to stand)\n121 mm (distance from optical axis to dovetail mount for stage carrier)\nDimensions\n388 (H) x 300 (W) x 400 (D) mm\nWeight (total)\n20 – 30 kg \n20 – 40 kg\n20 – 30 kg\n20 – 40 kg\nWeight (stand)\n16.6 kg \n17.5 kg \n16.4 kg\n17.0 kg\nEyepiece\nField of view number 23/25\nObjective magniﬁcation\n1x – 100x\nObjectives\nReﬂected light:  \nEC EPIPLAN, EC Epiplan-NEOFLUAR, EC Epiplan-APOCHROMAT\nTransmitted light: N-ACHROPLAN, EC Plan-NEOFLUAR, Plan-APOCHROMAT, C-APOCHROMAT, FLUAR\nSpecial:  \nLD EPIPLAN, LD EC Epiplan-NEOFLUAR\nCondensers\nManual/motorized achromatic, manual/motorized achromatic-aplanatic, manual/motorized \nachromatic-aplanatic Universal, LD and darkﬁeld condensers\nTubes\nBinocular tubes, phototubes, ergotubes and ergophototubes\nStages\nManual/motorized mechanical stages, 360° pol-rotary stages and scanning stages\nIllumination\nReﬂected light:  \n12V 100W HAL, 12V 100W HBO\nTransmitted light: 12V 100W HAL, 12V LED\nContrasting techniques  \nReﬂected light:  \n Brightﬁeld, darkﬁeld, Differential Interference Contrast, Circular Differential Interference Contrast,  \nsimple polarization, ﬂuorescence \nTransmitted light:  Brightﬁeld, darkﬁeld, Differential Interference Contrast, phase contrast, polarization\n\n\nPage 13\n18\nSystem Overview\n\n\nPage 14\n19\nSystem Overview\n\n\nPage 15\n20\n\n\nPage 16\n21\n\n\nPage 17\n22\n\n\nPage 18\n23\n\n\nPage 19\nInformation subject to change.\nPrinted on environmentally-friendly paper, \nbleached without chlorine.\n70-2-0020/e – printed 05.09\nNew Horizons in Materials Microscopy\nThe Future Before Your Eyes\nCarl Zeiss MicroImaging GmbH\n07740 Jena, Germany\nIndustrial | Göttingen Location\nPhone  :  +49 551 5060 660\nTelefax :  +49 551 5060 464\nE-Mail  :  micro@zeiss.de\nwww.zeiss.de/AxioImagerMAT\nFind out more about our patents at:\nwww.zeiss.de/mikro-patente\nStandards met:\nISO 9001, ISO 13485, \nISO 14001\nAxio Imager 2 from Carl Zeiss is a system platform that \ncan be used for demanding quality control and materials \nanalysis tasks, as well as for the development of new \nmaterials. The stands are exceptionally Ç exible and can be \nexpanded to cover a wide range of applications, meaning \nthat Carl Zeiss can offer you a high degree of adaptability \nin line with your future requirements. The combination of \na motorized stand with additional motorized components, \nplus camera and control software, enables the systems to \nbe used optimally for your applications, with maximum \nefÆ ciency and comfort. \nAxio Imager 2 from Carl Zeiss is just as well suited to \nresearch as it is to routine applications and sets new \nstandards in materials microscopy. The stable cell provides \nideal conditions for vibration-free work, and – thanks to \nthe sophisticated production technology from Carl Zeiss – \nyou can be conÆ dent that you are buying a product that \nwill stand the test of time.\nAllied High Tech Products, Inc.\n2376 E. Pacifica Place\nRancho Dominguez, CA 90220\n(800) 675-1118 (US &amp; Canada)\n(310) 635-2466 (Worldwide)\n(310) 762-6808 Fax\nwww.alliedhightech.com\n</pre></details>",
  "summary": "AxioImager A2ROpen original PDFFull searchable text · 19 pagesRefer to the original PDF for tables, figures and page layout.Page 1 The Standards: Light Microscopy for the Toughest Challenges in Materials Analysis and Quality Control Axio Imager 2 A New Dimension in Performance Mic ro s c o py f ro m C a r l Zei s s Page 2 Axio Imager 2 Visionary Performance Whether in R&D, quality control or failure analysis, the challenges facing materials microscopy are becoming greater every day. With the…",
  "sections": [],
  "updated_at": "2026-10-17T20:52:43.954326+00:00"
}