{ "title": "MultiPrep™ System - 8\"", "kind": "product", "company": "Allied High Tech Products", "category": "Lapping, honing & superfinishing", "parameters": { "Language": "English", "Captured": "2026-10-17", "Part numbers": "15-2200; 15-2200-TEM; 15-1005; 15-1010; 15-1010-RE; 15-1013; 15-1014; 15-1018; 15-1020; 15-1020-80; 15-1020-100; 15-1020-AI; 15-1020-AIP; 15-1025; 15-1035; 15-1045; 15-1046; 15-1047; 15-1048; 15-1050; 15-1051; 120-30015; 10-1005; 5-8100; 5-8105" }, "language": "en", "source_url": "https://www.alliedhightech.com/Equipment/multiprep-polishing-system-8", "content_html": "
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The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation. 

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Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill. 

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Dual micrometers (pitch and roll) allow precise sample tilt adjustments relative to the abrasive plane. A rigid Z-indexing spindle maintains the predefined geometric orientation throughout the grinding/polishing process. Digital indicators enable quantifiable material removal, which can be monitored real-time, or preset for unattended operation. Variable speed rotation and oscillation maximize the use of the entire grinding/polishing disc and minimize artifacts. Adjustable load control expands its capability to handle a range of small (delicate) to large samples.

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Features

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MultiPrep Positioning Head Features:

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Front digital indicator to display real-time material removal (sample advancement), 1 µm resolution Precision spindle that indexes the sample perpendicular to the platen, and can rotate simultaneously
Dual axis, micrometer controlled angular positioning of the sample (pitch and roll): +10°/-2.5° range (0.02° increments) Rear digital indicator to display vertical positioning (static) with zeroing function, 1 µm resolution
Full or limited automatic sample rotation with 8 speeds Cam-locking system that eliminates the need for tools and allows for precise repositioning of fixtures
Variable sample load: 0-600 g (100 g increments) Designed & manufactured by Allied in the USA
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Grinder/Polisher Features:

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Variable platen speed: 5-350 RPM (5 RPM increments) Digital timer and tachometer
7\" color LCD touchscreen with keypad entry to control all functions Clockwise/counterclockwise platen rotation
Seamless integration with optional AD-5™ Fluid Dispenser for automatic operation Electronic coolant control with adjustable valve
Powerful, quiet 0.7 HP (535 W) Brushless DC motor that provides constant high torque output throughout the speed range Stable RIM, aluminum and stainless steel construction
Molded one-piece corrosion and impact resistant cover Overflow diversion protects internal components
Designed & manufactured by Allied in the USA Two (2) year warranty
CE compliant for EU 
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Item #Description
15-2200MULTIPREP™ PRECISION POLISHING SYSTEM for 8\" Platen, 100-240 V 50/60 Hz 1 Phase Includes: Splash Ring & Platen Cover, Dial Indicator Calibration Kit, Fixture/Accessory Storage Case
15-2200-TEMMULTIPREP™ SYSTEM with O-Ring Drive, for 8\" Platen, 100-240 V 50/60 Hz 1 Phase - Designed for TEM Sample Preparation of Delicate Materials Includes: Splash Ring & Platen Cover, Dial Indicator Calibration Kit, Fixture/Accessory Storage Case
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Product Accessories

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NOTE: Precision/Magnetic Platens, Fixtures and Accessories are SOLD SEPARATELY. Please choose from the list of accessories below to ensure a complete system is configured for quotation.

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Item #Description
15-1005Click to Enlarge »Cam-Lock Adapter for #15-1010, #15-1010-RE, #15-1013
15-1010Click to Enlarge »Cross-Sectioning Paddle with Removable 3.1 mm SEM
15-1010-REClick to Enlarge »Cross-Sectioning Paddle with Reference Edge for #15-1005, #69-50000, #69-41000, #69-41005
15-1013Click to Enlarge »TEM Wedge/FIB Thinning Paddle with 5.3 mm W x 3.5 mm D x 17 mm L Pyrex® Insert
15-1014Click to Enlarge »TEM Wedge/FIB Fixture Body and Pk/4 #69-40015 Pyrex® Inserts
15-1018Click to Enlarge »Specimen Thinning Fixture with 0.5” D x 0.4” H (12.7 x 10.2 mm) Pyrex® Insert
15-1020Click to Enlarge »Parallel Polishing Fixture, Stainless Steel, 2.25\" (57 mm) Diameter
15-1020-80Click to Enlarge »Parallel Polishing Fixture, Stainless Steel, 3\" (80 mm) Diameter
15-1020-100Click to Enlarge »Parallel Polishing Fixture, Stainless Steel, 4\" (100 mm) Diameter
15-1020-AIClick to Enlarge »Parallel Polishing Fixture, Center Axis, Including (1) #15-1020-AIP SEM/FIB Sample Mount with 3.1 mm Pin, 24.5 mm Ø (Pk/2)
15-1020-AIPClick to Enlarge »SEM/FIB sample mount with 3.1 mm pin, 24.5 mm Ø (Pk/2)
15-1025Click to Enlarge »Teardrop Fixture 40 mm Mount Capacity
15-1035Click to Enlarge »Weight Kit including: (1) 200 and (1) 100 gram Barrel Weights, (1) 200, (1) 100, and (1) 50 Gram Slotted Weights and (1) Holding Rod
15-1045Click to Enlarge »Multipurpose Fixture, 2\" W x 1\" H x 0.75\" D (51 x 25 x 19 mm) Pocket
15-1046Click to Enlarge »Multipurpose Fixture, 45° Diagonal Orientation, 2\" W x 1\" H x 0.80\" D (51 x 25 x 20 mm) Pocket
15-1047Click to Enlarge »Multipurpose Fixture, 1.00\" W x 0.40\" H x 0.45\" D (25 x 19 x 11 mm) Pocket
15-1048Click to Enlarge »Multipurpose Fixture, 45° Diagonal Orientation, 1.0\" W x 0.4\" H x 0.5\" D (51 x 10.2 x 12.7 mm) Pocket
15-1050Click to Enlarge »Cross-Sectioning Paddle, Clamp Style with 0.63\" W x 0.10\" H x 0.25\" D (16 x 2.5 x 6.4 mm) Pocket
15-1051Click to Enlarge »Cross-Sectioning Paddle, Clamp Style, Diagonal Orientation with 0.63\" W x 0.10\" H x 0.25\" D (16 x 2.5 x 6.4 mm) Pocket
120-30015Click to Enlarge »Digital Indicator Measurement System, with Granite Stand (6\" W x 8\" D x 2-1/2\" H), Height Adjustable Indicator Position (Lifting Lever Included), Metric and Imperial Indicator Selectable, 0.001 mm (1-micron Resolution), 25 mm Range of Motion
10-1005Click to Enlarge »Precision Aluminum Platen, 8\" (203 mm)
5-8100Click to Enlarge »Platen Storage Cabinet for Platens, Discs or Cloths up to 12\" (305 mm) Diameter
5-8105Click to Enlarge »Aluminum Tray/Shelf
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Source documents

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", "summary": "The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation. Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill. Dual micrometers (pitch and roll) allow precise sample tilt adjustments relative to the abrasive plane. A rigid…", "sections": [], "updated_at": "2026-10-17T21:12:06.592434+00:00" }