{
  "title": "Presentation of TEM Sample Preparation and Optical Microscopy",
  "kind": "reference",
  "company": "Allied High Tech Products",
  "category": "Metrology & quality control",
  "parameters": {
    "Language": "English",
    "Captured": "2026-10-17"
  },
  "language": "en",
  "source_url": "https://www.alliedhightech.com/news/presentation-of-tem-sample-preparation-and-optical-microscopy",
  "content_html": "<div>\n                            <div>\n<article>\n    <div>\n    <header>\n        \n\n<h2>Presentation of TEM Sample Preparation and Optical Microscopy</h2>\n\n\n    </header>\n    <div>\n    <div>\n        <div>\n                <p><span>Sample preparation using mechanical abrasive methods for transmission electron microscopy (TEM) is one of the many techniques Allied High Tech Products, Inc. has developed. This presentation will outline the important aspects of the preparation process, including thinning, polishing, wedge creation, and imaging, for bulk and site-specific applications.</span></p>\n<p></p>\n<p><a href=\"/records/allied-tem-sample-prep-and-optical-microscopy-9dedf27f51\" title=\"TEM Sample Preparation\" rel=\"noopener noreferrer\"></a></p>\n<p><a href=\"/records/allied-tem-sample-prep-and-optical-microscopy-9dedf27f51\" title=\"TEM Sample Preparation\" rel=\"noopener noreferrer\"><span><img src=\"/files/allied-file-97527dec2a870690047cfced/Allied%20High%20Tech%20Products%20-%20TEM%20Sample%20Prep%20and%20Optical%20Microscopy-1.jpg\" alt=\"\" loading=\"lazy\" style=\"max-height:440px;width:auto\"></span></a></p>\n<p></p>\n<p></p>\n        </div>\n    </div>\n    </div>\n    </div>\n</article></div>\n                        </div>\n                    <h2>Source documents</h2><ul><li><a href=\"/records/allied-tem-sample-prep-and-optical-microscopy-9dedf27f51\">TEM Sample Prep and Optical Microscopy.pdf</a></li><li><a href=\"/records/allied-tem-sample-prep-and-optical-microscopy-9dedf27f51\">TEM Sample Prep and Optical Microscopy.pdf</a></li></ul>",
  "summary": "Presentation of TEM Sample Preparation and Optical Microscopy Sample preparation using mechanical abrasive methods for transmission electron microscopy (TEM) is one of the many techniques Allied High Tech Products, Inc. has developed. This presentation will outline the important aspects of the preparation process, including thinning, polishing, wedge creation, and imaging, for bulk and site-specific applications. Source documentsTEM Sample Prep and Optical Microscopy.pdfTEM Sample Prep and…",
  "sections": [],
  "updated_at": "2026-10-17T21:12:06.592434+00:00"
}