{ "title": "X-Prep® Vision™ - Substrate Measurement Instrument", "kind": "product", "company": "Allied High Tech Products", "category": "Metrology & quality control", "parameters": { "Language": "English", "Captured": "2026-10-17", "Part numbers": "15-50105" }, "language": "en", "source_url": "https://www.alliedhightech.com/Equipment/x-prep-vision-substrate-measurement-instrument", "content_html": "
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The X-Prep® Vision™ is a metrology tool that enables measurement of silicon and semitransparent substrates. It is necessary for applications that require uniform thinning to a specific target with a tolerance of +/- 3 µm or better.

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The X-Prep® fixture adapter is also secured to the motorized stage on the X-Prep® Vision™, ensuring the measurement/tool control coordinates remain aligned when transferred between systems. 

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A library with over 130 materials (i.e., GaAs, InGaAs, SiC, Sapphire/Al2O3, InP, SiGe, GaN, photo-resist) is included with every system.

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Meaurement & Observation - How it Works

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IR light is focused onto a sample, and a unique signal based on the refractive index of the material is created. The return signal is analyzed by the software to produce a thickness value.

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Measuring Below 10 µm Thickness

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For applications requiring thinning to less than 10 µm, precise measurement is possible only by adding the visible light spectrometer accessory.

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Features

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Multipoint scan or single-point thickness measurement 10 microns to full thickness (1 mm) range of measurement (15 nm to 1 mm thick)
Motorized, automatic X/Y/Z (auto-focus) with <1s acquisition time Automatic edge and corner detection aligns measurement grid with X-Prep® - including theta correction
Edge exclusion with X/Y input Stage fitted with X-Prep® fixture adapter
\"Drive to Coordinate\" software navigation Viewing of either 2D plot/map or 3D graph
Supplied with Allied proprietary X-Correct™ software CCD camera included
Roughness - 15 micron finish 100 mm x 100 mm X/Y range of motion
Software automation extendable through .NET Data export using standard Windows methods
One (1) year warranty Dimensions: 14\" W x 17\" D x 19\" H (355 x 431 x 483 mm)
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Item #Description
15-50105X-PREP® VISION™ 100 SUBSTRATE MEASUREMENT INSTRUMENT, 100-240V AC 100 mm x 100 mm X/Y stage travel
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\n ", "summary": "The X-Prep® Vision™ is a metrology tool that enables measurement of silicon and semitransparent substrates. It is necessary for applications that require uniform thinning to a specific target with a tolerance of +/- 3 µm or better. The X-Prep® fixture adapter is also secured to the motorized stage on the X-Prep® Vision™, ensuring the measurement/tool control coordinates remain aligned when transferred between systems. A library with over 130 materials (i.e., GaAs, InGaAs, SiC, Sapphire/Al2O3,…", "sections": [], "updated_at": "2026-10-17T21:12:06.592434+00:00" }