{
  "title": "SEM（Scanning Electron Microscope）",
  "kind": "reference",
  "company": "GRISH / Beijing Grish Hitech",
  "category": "Lapping, honing & superfinishing",
  "parameters": {
    "Brand / publisher": "GRISH",
    "Content type": "glossary",
    "Language": "English"
  },
  "language": "en",
  "source_url": "https://grish.com/term/sem%ef%bc%88scanning-electron-microscope%ef%bc%89/",
  "content_html": "<p>Scanning electron micrograph, a microscopic analysis tool, is mainly used for surface microscopic morphology observation or surface element distribution observation.</p>\n",
  "summary": "Scanning electron micrograph, a microscopic analysis tool, is mainly used for surface microscopic morphology observation or surface element distribution observation.",
  "sections": [],
  "updated_at": "2026-10-16"
}