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Optical profiling and roughness measurement systems, supported by a public technical guide to surface measurements.
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Metrology & quality control
Optical profiling and roughness measurement systems, supported by a public technical guide to surface measurements.
Explore this category ↗209 indexed records
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Probe battery - WM-B1
Metrology & quality control · 2026-10-11
Camera installation attachment - WM-AT
Metrology & quality control · 2026-10-11
Wide Area CMM - WM-6225
Metrology & quality control · 2026-10-11
Wide Area CMM - WM-6210
Metrology & quality control · 2026-10-11
Wide Area CMM - WM-6025
Metrology & quality control · 2026-10-11
Wide Area CMM - WM-6010
Metrology & quality control · 2026-10-11
Wide Area Coordinate Measuring Machine - WM-3000
Metrology & quality control · 2026-10-11
ø10 mm stylus - OP-88918
Metrology & quality control · 2026-10-11
Camera movement positioning magnets - OP-88754
Metrology & quality control · 2026-10-11
ø2.5 mm small stylus - OP-88701
Metrology & quality control · 2026-10-11
Calibration cone for needle stylus - OP-88547
Metrology & quality control · 2026-10-11
Camera movement alignment cones - OP-88546
Metrology & quality control · 2026-10-11
- OP-88424
Metrology & quality control · 2026-10-11
Probe cradle - OP-88423
Metrology & quality control · 2026-10-11
ø5 mm 0.20" stylus - OP-88421
Metrology & quality control · 2026-10-11
Camera unit USB cable - OP-88420
Metrology & quality control · 2026-10-11
Camera unit dedicated AC adapter - OP-88369
Metrology & quality control · 2026-10-11
NR-XJ1 AC adapter - NR-XU1
Metrology & quality control · 2026-10-11
Battery charger for NR-XB1 Series - NR-XJ1
Metrology & quality control · 2026-10-11
Lithium Ion Battery - NR-XB1A
Metrology & quality control · 2026-10-11
ISO 25178 Surface texture measurement module - VK-H1XR
Metrology & quality control · 2026-10-11
Analysis Function Extension Module - VK-H1XP
Metrology & quality control · 2026-10-11
Particle Analysis Module - VK-H1XG
Metrology & quality control · 2026-10-11
Light-blocking cover - VL-C35
Metrology & quality control · 2026-10-11