Product / SKU
3D Scanner CMM Controller - VL-700
KEYENCE · Metrology & quality control
Technical specifications
| Manufacturer / publisher | KEYENCE |
|---|---|
| model | VL-700 |
| brand | KEYENCE |
| Type | Controller |
| Stage | VL-750,VL-730 |
| Measurement unit | VL-770 |
| Optical transmitter system | High-brightness dual projector module |
| Optical receiver system | Low/high magnification offset dual optical module with wide dynamic range |
| Captured data format | Full-color textured 3D mesh data |
| Repeatability (σ) | 2 μm |
| Measurement accuracy | ±10 μm |
| Measurement resolution | 9 million points |
| Measurement modes｜Low magnification | High speed, Normal, Fine (wide field) |
| Measurement modes｜High magnification | Normal, Fine (High resolution) |
| Measurement range｜Low magnification | ø300 × H 200 mm ø11.81" × H 7.87"(wide field) |
| Measurement range｜High magnification | ø70 × H 50 mm ø2.76" × H 1.97"(High resolution) |
| Extended measurement｜Automatic rotation combined measurements | ✓ |
| Extended measurement｜Automatic XY combined measurements | VL-750: ✓ VL-730: — |
| Extended measurement｜Automatic XY combined measurement range｜Low magnification (2 × 2 composition) | VL-750: ø500 × H 200 mm ø19.69" × H 7.87" VL-730: — |
| Extended measurement｜Automatic XY combined measurement range｜Low magnification (3 × 1 composition) | VL-750: W 580 × D 300 × H 200 mm W 22.83" × D 11.81" × H 7.87" VL-730: — |
| Extended measurement｜Automatic XY combined measurement range｜High magnification (2 × 2 composition) | VL-750: ø110 × H 50 mm ø4.33" × H 1.97" VL-730: — |
| Extended measurement｜Automatic XY combined measurement range｜High magnification (3 × 1 composition) | VL-750: W 150 × D 70 × H 50 mm W 5.91" × D 2.76" × H 1.97" VL-730: — |
| Stage｜Stage configuration | VL-750: Motorized XYθ stage mechanism VL-730: Motorized θ stage mechanism |
| Stage｜Stage top panel size | ø500 mm ø19.69" |
| Stage｜Stage rotation | 360° (infinite rotation) |
| Stage｜Stage movement range | VL-750: ø200 mm ø7.87" VL-730: — |
| Category | Metrology & quality control |
| Updated | 2026-10-11 |
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