AxioImager A2R
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Page 1
The Standards: Light Microscopy for the Toughest
Challenges in Materials Analysis and Quality Control
Axio Imager 2
A New Dimension in Performance
Mic ro s c o py f ro m C a r l Zei s s
Page 2
Axio Imager 2
Visionary Performance
Whether in R&D, quality control or failure analysis, the
challenges facing materials microscopy are becoming
greater every day. With the triedandtested Axio Imager
system platform from Carl Zeiss you will be able to win
these challenges. The Axio Imager microscopes offer the
very highest quality: sharper images, higher optical and
operational performance with greater comfort – not only
in research, but also in routine applications. Axio Imager 2
stands out thanks to its sophisticated operating concept
and flexible interfaces for external communication and
network connections. And Carl Zeiss’ future-oriented
modular concept means that these durable and robust
systems will be able to cope with any future requirements
that arise. Several outstanding features of this second-
generation Axio Imager are:
• an optimized operating concept
• improved optics with superb contrast and excellent
resolution
• forward-looking stand concept for upgradeability
• innovative design for maximum stability and
vibration-free work
• optional automated functions for enhanced operating
comfort
• exceptional ergonomics for stress-free use
• an integrated system approach for digital imaging
solutions providing high quality reproducible results
With this second-generation Axio Imager Carl Zeiss is
responding to the increasing demands of industry and
academia. Put your faith in a reliable, powerful and
cost-effective analysis platform and in the optimized quality
of light microscopy.
Cover image: cast iron with spherulitic graphite, polished.
Circular Differential Interference Contrast
EC Epiplan-APOCHROMAT 50x/0.95
With kind permission of Dr. H.-L. Steyer, Struers, Kesselsdorf,
Germany
Page 3
Contents
The Optics
4
The Contrasting Techniques
6
The Areas of Application
8
The Software
10
The Cameras
12
Confocal Laser Scanning Microscopy
13
The Design
14
The Ergonomics
15
Specifications
16
System Overview
18
Page 4
4
The Optics
A New Quality Before Your Eyes
The objective series
Experience enhanced contrast (EC)
To obtain comprehensive image information, you need to use
a wide range of objectives. With the Axio Imager objective
series Carl Zeiss has provided solutions for all levels of optical
requirements and price / performance categories.
EC EPIPLAN objectives
An economical, all-around series of objectives, which have
been achromatically corrected with minimum optically
strain for an impressive quality DIC, and, in addition, pro-
viding a flat field image for a 23 mm field of view. They are
available in brightfield or brightfield/darkfield versions.
Differential Interference Contrast in circularly polarized
light is also possible with all EC EPIPLAN objectives using
only a single C-DIC prism.
EC Epiplan-NEOFLUAR objectives
The particularly high-contrast EC Epiplan-NEOFLUAR
objectives, which have high degree of correction and
minimized optical strain, enabling you to achieve sharp
C-DIC and a flat, in focus, 25 mm field of view – ideal for
viewing fine color and structural details, e.g. lamellae in
spherulitic graphite. Available as DIC/C-DIC, Brightfield/
Darkfield, Pol and LD (long working distance) versions,
they also offer the additional benefits of long working
distances and high numerical apertures.
EC Epiplan-APOCHROMAT objectives
The EC Epiplan-APOCHROMAT objectives satisfy the very
highest demands. They are ideal for imaging color and
structural details in the sub-micrometer range and are
renowned for offering the best optical correction and
highest numerical apertures. Based on ICS optics from
Carl Zeiss, these innovative Enhanced Contrast objectives
perform at the limits of what optics can achieve with regard
to contrast and image fidelity.
The new Axio Imager generation is the result of the latest innovations in optical
design. Carl Zeiss has taken its renowned optical performance to new heights once
again and has carefully designed and optimized all relevant components. Discover
the visible advances that have been made in image contrast and resolution.
The illumination concept
Obtain brilliant image quality
An innovative illumination concept has been specially deve-
loped for the Axio Imager, enabling you to see your specimen
in brightfield and darkfield with unprecedented quality,
minimized stray light and imaging that is virtually aberration
-free. Outstanding image contrast is achieved, especially in
interference contrast, even at very high magnifications.
Further information
can be found at
www.zeiss.de/objectives
Page 5
5
Greater comfort, simple change of
contrasting techniques: the modulator
turret for interference contrast
The tube lens turret
Increase your flexibility
With its expanded magnification range comprising a total
of five intermediate magnifications, the Axio Imager tube
lens turret offers greater variability when it comes to ad-
apting the desired field of view. The tube lens turret is
available in two models. 1) Encoded: this model allows
manual operation of the tube lens turret (magnification
change) while providing automatic feedback of the user
selection for reliable and repeatable documentation,
scaling factors and measurements. 2) Motorized: this model
offers you additional operating comfort for your system
solutions by automatic selection based on user-defined
configurations. The tube lens turret offers yet another
advantage: the use of a focusable Bertrand lens, an impor-
tant component for the easy observation of the objective
exit pupil.
The modulator turret
Easy to operate
Switching quickly and easily from interference contrast to
other techniques – the Axio Imager modulator turret has
been developed precisely with this goal in mind. Each of
the four positions can be easily selected with a simple
turn. The motorized model is particularly easy to operate.
When switching to interference contrast, the correct
prism with the setting you have previously defined is
automatically activated. If you switch to brightfield or
darkfield, the path is cleared automatically for fast and,
above all, reproducible results.
The reflector turret
Fast switching made easy
All Push&Click contrast modules can be stored securely in
six or ten positions and activated as needed using manual
or motorized operation.
Motorized apertures
Maintaining constant image quality
Using the motorized aperture and luminous field
diaphragms you can achieve error-free, reproducible
illumination settings and, consequently, constant image
quality. System integrated motorization guarantees you
comparable results and higher productivity by automating
the workflow.
The nosepiece
Seven eyes see more
The Axio Imager nosepiece provides room for up to seven
objectives. You now have a sufficient number of objectives
to use the entire standard magnification series from 1x to
100x. Naturally, it is also possible to combine objective
types, for example reflected light and transmitted light
objectives. Seven eyes – or room for seven objectives –
also mean that it is no longer necessary to exchange the
objectives, saving you time and increasing safety.
More options, faster handling:
the reflector turrets with Push&Click modules
Monitor: Al/Al2O3
composite material
Dirk Staudenecker,
University of Applied
Sciences, Materials
Engineering Working
Group, Aalen, Germany
Page 6
6
The Contrasting Techniques
Observing in New Dimensions
Brightfield and darkfield
Maximum homogeneity and a stray light free image
background
In brightfield the Axio Imager provides homogeneous
illumination and exceptional contrast while, in darkfield,
the background is so dark that the technique has earned a
new name: ADF – Advanced Darkfield. By minimizing
disturbing stray light and reducing the longitudinal color
aberration of the illumination optics, this darkfield is
suitable for the most challenging of samples and impresses
even when faced with the finest of structures. Switching
between techniques only requires a simple turn. The
motorized stand models allow you to work particularly
quickly and conveniently.
C-DIC
Perfect for all structures
Circular Differential Interference Contrast (C-DIC) is a
polarization-optical technique which, in contrast to ordina-
ry Differential Interference Contrast (DIC), uses circularly
polarized light. This technique has a number of decisive
advantages for the contrasting of differently aligned object
structures. The specimen no longer has to be rotated for
best image contrast and quality, as is the case in basic DIC.
With C-DIC it is simply enough to adjust the position of the
C-DIC prism to adjust for best image quality whether it
is for contrast and/or resolution independent of sample
orientation. And all this is possible using one C-DIC prism
for a homogeneous unsurpassed quality image.
New imaging options improve the visualization of your samples. The developments
we make at Carl Zeiss lead to new discoveries in research and more reliable testing
and results. This applies not only to standard, but also, in particular, to sophisticated
contrasting techniques, like the innovative C-DIC method. Axio Imager 2 will clearly
enable you to enhance your results.
Before: if the rules according to Köhler are
not precisely followed only inferior contrast
images are possible, even with the best
objectives.
After: ADF – Advanced Darkfield from
Carl Zeiss. The result speaks for itself.
August Köhler, Zeiss pioneer and one of the pioneers in microscopy.
The illumination principle named after him revolutionized microscopy.
KLA-Test structures, period 1.6 μm
EC Epiplan-APOCHROMAT 50x/0.95, ∞/0, camera-adapter 0.63x
50 μm
50 μm
Page 7
7
Brightfield:
Classic brightfield allows you to identify only the spherulitic formation.
Matrix: white (bright), graphite: black (dark).
Darkfield:
Unevenness in the polished surface (such as grooves of the phase boundaries between
graphite and matrix or notches) clearly reveals the shape of the spherulites and thus
the polishing quality. Structural features within the cut spherulites can be identified.
Starting from the crystallization nucleus, the cut surfaces of the graphite segments
become visible in their divergent orientation (preferred direction of crystallization).
Incomplete polished spherulites contain bright points and more extensive bright areas.
Circular Differential Interference Contrast (C-DIC):
The matrix is contrasted on the basis of the polishing relief. Hard and soft structural
constituents become visible, as does what remains of the polishing striae (exclusively
mechanically polished).
Polarization (crossed polars):
The optical activity, in particular anisotropy, makes the structure inside the
spherulites clearly visible.
Polarization with additional lambda compensator:
This technique allows optimal contrasting of the structure inside the spheru lite sec-
tion. The interference colors make it possible to see even more details than with
simply crossed polars.
20 μm
20 μm
20 μm
20 μm
20 μm
Cast iron with spherulitic
graphite, polished.
Images: same position and
same magnification, but with
different contrasting tech-
niques. Specimen preparation
and image interpretation:
Dr. H.-L. Steyer, Kesselsdorf,
Germany
Page 8
8
The Areas of Application
Opting for Versatility
The applications
Opaque or transparent
The range of materials and samples encountered in quality
control, materials testing and research is vast. Axio Imager
offers the perfect solution for performing analyses.
Metallic structures, composites, glass, wood and ceramics
can be analyzed just as effectively as polymers, liquid
crystals or semiconductor-based MEMs, wafers and photo-
voltaic elements, for example.
Contrasting
Competence in all contrasting techniques
Additional information helps you to make decisive
advances. You can choose from a variety of contrasting
techniques to achieve optimum optical quality for your
applications: in reflected light it is possible to observe your
samples in brightfield, darkfield, Differential Interference
Contrast (DIC), Circular Differential Interference Contrast
(C-DIC), polarization or fluorescence contrast, while in
transmitted light, you can examine your samples in bright-
field, darkfield, Differential Interference Contrast (DIC),
polarization or circular polarization.
The sample space can
be adjusted continuously
for sample heights from
0 to 63 mm.
The sample area
For samples from just a few μm to 63 mm in height
You can adjust the sample space individually to suit your
particular sample. The size can be adjusted within wide
ranges, depending on the configuration. If you are using
a reflected light stage support in combination with a
reflected light stage, it is possible to examine samples of
up to 63 mm in height, while with a transmitted light
stage support and transmitted light stage a height of
45 mm can be achieved.
Axio Imager 2 is an investment in the future, whether in the area of research, testing or failure
analysis. Here you will find a system integrated platform that offers you the perfect support
for your applications. Time and again the modular structure and application-specific
components will adapt to the growing and changing needs faced in our fast paced world.
The stage carrier can be removed or its height adjusted by hand.
Page 9
9
Liquid-crystalline phase of [C14mim]Br
Polarization contrast EC EPIPLAN 10x/0.20 at
100 °C in a THMS600 Linkam heating stage
Anna Getsis and Anja-Verena Mudring, Faculty
of Chemistry and Biochemistry, Solid-State
Chemistry and Materials, Ruhr-University
Bochum, Germany
Bundle of stretched polyelectrolyte molecules
Rhodamine G stain with fluorescence
LD EC Epiplan-NEOFLUAR 100x/0.75
Konstantin Demidenok, Leibniz Institute of
Polymer Research Dresden e.V., Germany
Tetrahedral inclusions in glass
Brightfield
SCHOTT AG, Corporate Research and
Technology Development, Mainz, Germany
Layer of gold detaching from a silicon wafer
Brightfield ACHROPLAN 10x/0.25
Fraunhofer Institute for Manufacturing
Technology and Applied Materials Research,
Department for Bonding Technology and
Surfaces, Bremen, Germany
Microhardness impression in a maraging steel
Brightfield EC Epiplan-NEOFLUAR, 50x/0.80
Sébastien Reymann, University of Applied
Sciences, Materials Engineering Working
Group, Aalen, Germany
Magnetic domains on a silicon-iron electrical
sheet Kerr microscopy
EC Epiplan-NEOFLUAR 20x/0.50
Dr. Rudolf Schäfer, Leibniz Institute for
Solid State and Materials Research Dresden,
Germany
AlNi3,5 anodized according to Barker
Polarization contrast
EC Epiplan-NEOFLUAR 20x/0.50
ACCESS e.V. Aachen and Foundry Institute
of RWTH Aachen University, Germany
Maraging steel recast structure, nital etch
with white, unetched areas
Differential Interference Contrast
EC Epiplan-NEOFLUAR, 50x/0.80
Sébastien Reymann, University of Applied
Sciences, Materials Engineering Working
Group, Aalen, Germany
Structure of the surface of a furniture wood
Darkfield EC Epiplan-
APOCHROMAT 10x/0.30
Carl Zeiss MicroImaging GmbH,
Light Microscopy, Göttingen, Germany
Stress cracks in acrylate layer
Brightfield ACHROPLAN 10x/0.25
Fraunhofer Institute for Manufacturing
Technology and Applied Materials Research,
Department for Bonding Technology and
Surfaces, Bremen, Germany
Page 10
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The Ergonomics
Relax While You Work
The touch screen
All key information at a glance
To simplify complex steps, Axio Imager.Z2m and .M2m
have all the main functions grouped together on a color
touch screen TFT-Display. This allows you to control all
motorized components easily at the touch of a button and
display and control the microscope status. If required, the
integrated light and contrast managers ensure the best
possible light and contrast setting. In addition to fixed
presettings, it is also possible to store complex procedures
as individual settings and retrieve them at any time with
just the touch of a button. The Axio Imager microscopes
are therefore ideal even in a multi-user environment.
The control buttons
Intuitive operation
Axio Imager has a well-designed operating concept. The
control buttons, which are arranged ergonomically around
the focusing drive, can be easily distinguished thanks to
their tactile surfaces. The manual stand has five pre-pro-
grammed buttons, while the motorized stand features ten
buttons, the functions of which can be freely configured.
The docking station
Remote microscopy
Axio Imager can be remotely controlled using a freely-
positionable control panel. This panel includes among
other features a focusing drive and illumination control.
Other functions can also be programmed, as required.
The panel offers an interface for the TFT-Display and for the
lateral X-Y control of the motorized stage. A well developed
concept that gives you a greater freedom of movement
and is highly ergonomic.
The ergophototube
Relaxed working
With its upright, unreversed image, 50 mm continuous height
adjustment, ergonomic, fixed viewing angle of 15º and a
continuous horizontal extension of 50 mm, the 50-15-50
ergophototube from Carl Zeiss satisfies the highest
standards in terms of comfort and provides unrestricted
optical quality in all positions.
Ergophototube
TFT-Display
Reflected light filter
Multifunctional control element
Docking station
Page 11
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Specifications
Axio Imager.A2m
Axio Imager.M2m
Axio Imager.D2m
Axio Imager.Z2m
Components
Option
A2
LED
A2
M2p
M2
D2
Z2
A2m
M2m
D2m
Z2m
Stand
manual
+
+
-
-
+
-
+
-
+
-
motorized
-
-
+
+
O*
+
-
+
O*
+
Encoding
readable by PC
+
+
+
+
+
+
+
+
+
+
Tube lens turret
encoded
O
O
O
O
O
O
O
O
O
O
motorized
-
-
O
O
-
O
-
O
-
O
Reflector turret
6x encoded
O
O
O
O
O
O
O
-
O
O
6x motorized
-
-
O
O
O
O
-
+
O
O
6x motorized ACR
-
-
-
-
-
O
-
-
-
O
10x motorized ACR**
-
-
-
-
O
O
-
-
O
O
Nosepiece
6x encoded POL
O
O
-
O
O
O
O
O
O
O
6x encoded HD DIC
O
O
-
O
O
O
O
O
O
O
6x motorized HD DIC
-
-
-
O
-
O
-
O
-
O
6x motorized HD DIC ACR
-
-
-
O
-
O
-
O
-
O
7x encoded HD
O
O
+
O
O
O
O
O
O
O
7x motorized HD
-
-
-
O
-
O
-
O
-
O
Modulator turret C-DIC/TIC
manual
O
O
O
O
O
O
O
O
O
O
motorized*****
-
-
-
O
-
O
-
O
-
O
Modulator turret for
transmitted light - DIC
motorized*****
-
-
-
-
-
O
-
-
-
O
Transmitted light LED
-
+
O
+
O
O
O
O
O
O
O
Transmitted-light illumination
manual
-
+
-
-
+
-
O
O
O
O
motorized
-
-
-
+
-
+
-
-
-
O
Double filter wheel
(transmitted light)
manual
-
+
-
O
O
O
O
O
O
O
motorized
-
-
-
O
-
O
-
-
-
O
Reflected-light illumination
manual***
O
O
O
O
O
O
+
-
+
-
motorized***
-
-
-
-
-
O
-
+
-
+
Luminous field diaphragm
(reflected light)
manual
O
O
O
O
O
O
+
O
+
O
motorized
-
-
-
-
-
O
-
O
-
O
Aperture diaphragm
(reflected light)
manual
O
O
O
O
O
O
O
O
O
O
motorized
-
-
-
-
-
O
-
O
-
O
Double filter wheel
(reflected light)
manual
O
O
O
O
O
O
O
O
O
O
motorized
-
-
-
O
-
O
-
O
-
O
FL attenuator
manual
O
O
O
O
O
O
O
O
O
O
motorized
-
-
-
-
-
O
-
O
-
O
Switching reflected
light/transmitted light
manual
+
+
-
-
+
-
+
-
+
-
by means of a software
-
-
+
+
-
+
-
+
-
+
Mixed light using additional
power supply unit
manual
+
+
-
-
+
-
+
-
+
-
by means of a software
-
-
+
+
-
+
-
+
-
+
Focus (z-axis)
manual
+
+
-
-
+
-
+
-
+
-
motorized 25 nm
-
-
+
+
-
-
-
+
-
-
High-performance focus (10 nm)
-
-
-
-
-
+
-
-
-
+
TFT-Display
-
-
-
O
+
-
+
-
+
-
+
ApoTome
-
O
O
O
O
O
O
O
O
O
O
Power supply unit
external
-
-
+
+
-
+
-
+
-
+
internal
+
+
-
-
+
-
+
-
+
-
CAN BUS stages
motorized****
O
O
O
O
O
O
O
O
O
O
Scanning stages
Piezo
O
O
O
O
O
O
O
O
O
O
DC / stepper motors
O
O
O
O
O
O
O
O
O
O
Fast Z-Piezo insert
with manual stage
O
O
O
O
O
O
O
O
O
O
with scanning stage
O
O
O
O
O
O
O
O
O
O
Motorized 2TV tube
-
-
-
O
O
-
O
-
O
-
O
Condensers
manual
O
O
O
O
O
O
O
O
O
O
motorized
-
-
O
O
-
O
-
O
-
O
Page 12
17
+
= included with stand
O
= optional
-
= not possible
*
= possible to use motorized (6-pos. and 10-pos.) reflector turret
**
= ACR function not possible with Axio Imager.D2 and .D2m
***
= all reflected light illuminations contain a motorized shutter
This can be replaced by a high-speed shutter for fluorescence applications (optional).
**** = for use on the Axio Imager.A2, .A2m, .D2 and .D2m, USB/CAN converter 432909 is required
***** = only in connection with motorized nosepiece
Measurements
in mm (inch)
Stand
Axio Imager.A2m
Axio Imager.M2m
Axio Imager.D2m
Axio Imager.Z2m
Contrast manager
-
+
-
+
Light manager
+
+
+
+
TFT-Display
-
+
-
+
Remote control
-
O (docking station)
-
O (docking station)
Height of sample space
0 – 63 mm (reflected-light stage carrier)
0 – 45 mm (reflected-light/transmitted-light stage carrier for removable condenser holder)
0 – 25 mm (reflected-light/transmitted-light stage carrier with condenser holder)
Depth of sample space
136 mm (distance from optical axis to stand)
121 mm (distance from optical axis to dovetail mount for stage carrier)
Dimensions
388 (H) x 300 (W) x 400 (D) mm
Weight (total)
20 – 30 kg
20 – 40 kg
20 – 30 kg
20 – 40 kg
Weight (stand)
16.6 kg
17.5 kg
16.4 kg
17.0 kg
Eyepiece
Field of view number 23/25
Objective magnification
1x – 100x
Objectives
Reflected light:
EC EPIPLAN, EC Epiplan-NEOFLUAR, EC Epiplan-APOCHROMAT
Transmitted light: N-ACHROPLAN, EC Plan-NEOFLUAR, Plan-APOCHROMAT, C-APOCHROMAT, FLUAR
Special:
LD EPIPLAN, LD EC Epiplan-NEOFLUAR
Condensers
Manual/motorized achromatic, manual/motorized achromatic-aplanatic, manual/motorized
achromatic-aplanatic Universal, LD and darkfield condensers
Tubes
Binocular tubes, phototubes, ergotubes and ergophototubes
Stages
Manual/motorized mechanical stages, 360° pol-rotary stages and scanning stages
Illumination
Reflected light:
12V 100W HAL, 12V 100W HBO
Transmitted light: 12V 100W HAL, 12V LED
Contrasting techniques
Reflected light:
Brightfield, darkfield, Differential Interference Contrast, Circular Differential Interference Contrast,
simple polarization, fluorescence
Transmitted light: Brightfield, darkfield, Differential Interference Contrast, phase contrast, polarization
Page 13
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System Overview
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System Overview
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Information subject to change.
Printed on environmentally-friendly paper,
bleached without chlorine.
70-2-0020/e – printed 05.09
New Horizons in Materials Microscopy
The Future Before Your Eyes
Carl Zeiss MicroImaging GmbH
07740 Jena, Germany
Industrial | Göttingen Location
Phone : +49 551 5060 660
Telefax : +49 551 5060 464
E-Mail : micro@zeiss.de
www.zeiss.de/AxioImagerMAT
Find out more about our patents at:
www.zeiss.de/mikro-patente
Standards met:
ISO 9001, ISO 13485,
ISO 14001
Axio Imager 2 from Carl Zeiss is a system platform that
can be used for demanding quality control and materials
analysis tasks, as well as for the development of new
materials. The stands are exceptionally Ç exible and can be
expanded to cover a wide range of applications, meaning
that Carl Zeiss can offer you a high degree of adaptability
in line with your future requirements. The combination of
a motorized stand with additional motorized components,
plus camera and control software, enables the systems to
be used optimally for your applications, with maximum
efÆ ciency and comfort.
Axio Imager 2 from Carl Zeiss is just as well suited to
research as it is to routine applications and sets new
standards in materials microscopy. The stable cell provides
ideal conditions for vibration-free work, and – thanks to
the sophisticated production technology from Carl Zeiss –
you can be conÆ dent that you are buying a product that
will stand the test of time.
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