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Electronics via plating preparation insight

Learn how to quickly and accurately assess via plating thickness for the electronics industry. Our application specialists demonstrate a 17-minute materialographic method for preparing via-plated samples for thickness analysis.

Product & technical referenceStruersLapping, honing & superfinishing

Technical profile

Manufacturer / publisherStruers
LanguageEnglish
CategoryLapping, honing & superfinishing
Updated2026-10-17
Struers published content
Source: https://www.struers.com/en/electronics/via · Original publication: 2025-11-12. Manufacturer claims and terminology are reproduced as source material.Explore Materials & applications ↗

Via Challenge

To get the true picture of the via plating thickness, it is essential that the cross-section is made in the exact center of the via. It is preferred to cross-section multiple vias simultaneously. This is where manual preparation becomes difficult even for the skilled person.

Via Challenge
Via Challenge

Solution:

A short and reproducible five-step preparation method taking only 17 minutes results in ready-to-inspect cross sections. The material removal is controlled throughout the preparation, resulting in samples exposing the exact centers of the 100 and 200 µm vias. Automated coupon extraction and preparation eliminate the risk of passing the target and contribute to high reproducibility.

Tell us who you are, and you may download a materialographic solution report of one of our many solution methods. Please don’t hesitate to contact us if you have a specific problem that you would like us to help you with.

See the solution

Electronics via plating preparation insight | Struers.com

Learn how to quickly and accurately assess via plating thickness for the electronics industry. Our application specialists demonstrate a 17-minute materialographic method for preparing via-plated samples for thickness analysis.

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