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POLISHX/Controller - VK-X250K
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Controller - VK-X250K

KEYENCE · Metrology & quality control

Technical specifications

Manufacturer / publisherKEYENCE
modelVK-X250K
brandKEYENCE
Total magnificationUp to 28000×
Field of view (minimum range)11 µm to 5400 µm
Frame rate|Laser measurement speed4 to 120 Hz, 7900 Hz
Measurement principles|Optical systemPinhole confocal optical system
Measurement principles|Light receiving element16-bit photomultiplier
Measurement principles|Scanning method (during general measurement and image stitching)Automatic upper/lower limit setting, high-speed light intensity optimization (AAGII), poor reflected light intensity supplement (Double Scan)
Height measurement|Display resolution0.5 nm
Height measurement|Linear scale0.5 nm
Height measurement|Dynamic range16 bits
Height measurement|Repeatability σ20× 40 nm , 50× 12 nm , 150× 12 nm
Height measurement|Memory for Z-axis measurement14 million steps
Height measurement|Accuracy0.2+L/100 µm or less (L=Measuring Length)
Z stage configuration|StructureBase with separate measuring head
Z stage configuration|Maximum sample height28 mm 1.102", 128 mm 5.039" (option)
Width measurement|Display resolution1 nm
Width measurement|Repeatability 3σ20× 100 nm, 50× 40 nm , 150× 20 nm
Width measurement|Accuracy±2%
XY stage configuration|Manual: Operating range70 mm×70 mm 2.76" × 2.76"
XY stage configuration|Motorized: Operating range50 mm × 50 mm 1.97" × 1.97" 100 mm × 100 mm 3.94" × 3.94"
Observation|Observation imageSuper-high-resolution color CCD image 16-bit laser color confocal image Confocal + ND filter optical system C-laser differential interference image
Observation|Maximum capture resolution3072×2304
Weight|Microscope unitApprox. 26 kg (sensor head detached: approx. 10 kg)
CategoryMetrology & quality control
Updated2026-10-11

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