Product / SKU
Wide-Area 3D Measurement System Head - VR-3200
KEYENCE · Metrology & quality control
Technical specifications
| Manufacturer / publisher | KEYENCE |
|---|---|
| model | VR-3200 |
| brand | KEYENCE |
| Type | Head |
| Applicable controller | VR-3000K |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 12x｜Horizontal | 24.0 mm 0.94" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 12x｜Vertical | 18.0 mm 0.71" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 25x｜Horizontal | 12.0 mm 0.47" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 25x｜Vertical | 9.0 mm 0.35" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 38x｜Horizontal | 8.0 mm 0.31" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 38x｜Vertical | 6.0 mm 0.24" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 50x｜Horizontal | 6.0 mm 0.24" |
| Field-of-view｜Wide-field mode｜Magnification on a15" monitor 50x｜Vertical | 4.5 mm 0.18" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 40x｜Horizontal | 7.6 mm 0.30" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 40x｜Vertical | 5.7 mm 0.22" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 80x｜Horizontal | 3.8 mm 0.15" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 80x｜Vertical | 2.9 mm 0.11" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 120x｜Horizontal | 2.5 mm 0.10" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 120x｜Vertical | 1.9 mm 0.07" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 160x｜Horizontal | 1.9 mm 0.07" |
| Field-of-view｜High magnification mode｜Magnification on a15" monitor 160x｜Vertical | 1.4 mm 0.06" |
| Zoom | 1x to 4x |
| Measurable height | Wide-field mode：10 mm 0.39" (±5 mm ±0.20") High magnification mode：1 mm 0.04" (±0.5 mm ±0.02") |
| Display resolution | 0.1 µm |
| Repeatability (σ)｜Height measurement | 0.5 µm |
| Repeatability (σ)｜Width measurement | Wide-field mode: 1 µm, High magnification mode: 0.5 µm |
| Measurementaccuracy｜Height measurement | ±3 µm |
| Measurementaccuracy｜Width measurement | Wide-field mode: ±5 µm, High magnification mode: ±2 µm |
| Category | Metrology & quality control |
| Updated | 2026-10-11 |
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